A common unit of measure for failure rates of electronic components is the Failure unIT (FIT), expressed as a rate of failures per billion device hours. Another well known but less used measure is mean time between failures (MTBF), which is the average time of operation of a particular component until it fails. Consider a 1 MB memory of a 16-bit microprocessor with 256K × 1 DRAMs. Calculate its MTBF assuming 2000 FITS for each DRAM.