=+A stratified estimate of the overall proportion of defects can be used to help estimate the eventual
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=+A stratified estimate of the overall proportion of defects can be used to help estimate the eventual yield of the IC manufacturing process.
In one such study, to estimate the proportion
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Applied Statistics For Engineers And Scientists
ISBN: 9781133111368
3rd Edition
Authors: Jay L. Devore, Nicholas R. Farnum, Jimmy A. Doi
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