An article in Electronic Packaging and Production (2002, Vol. 42) considered the effect of X-ray inspection of

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An article in Electronic Packaging and Production

(2002, Vol. 42) considered the effect of X-ray inspection of

integrated circuits. The rads (radiation dose) were studied as a

function of current (in milliamps) and exposure time (in minutes).

The data are in Table E12-7.

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Applied Statistics And Probability For Engineers

ISBN: 9781118539712

6th Edition

Authors: Douglas C. Montgomery, George C. Runger

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