An article in Electronic Packaging and Production

(2002, Vol. 42) considered the effect of X-ray inspection of

integrated circuits. The rads (radiation dose) were studied as a

function of current (in milliamps) and exposure time (in minutes).

The data are in Table E12-7.

Rads mAmps Exposure Time 7.4 10 14.8 10 0.25 0.5 29.6 10 1 59.2 10 2 88.8 10 3 296 10 10 444 10 15 592 10 20 11.1 15 22.2 15 44.4 15 0.25 0.5 1 88.8 15 2