An article in Electronic Packaging and Production (2002, Vol. 42) considered the effect of X-ray inspection of
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An article in Electronic Packaging and Production
(2002, Vol. 42) considered the effect of X-ray inspection of
integrated circuits. The rads (radiation dose) were studied as a
function of current (in milliamps) and exposure time (in minutes).
The data are in Table E12-7.
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Related Book For
Applied Statistics And Probability For Engineers
ISBN: 9781118539712
6th Edition
Authors: Douglas C. Montgomery, George C. Runger
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