Conduct the analyses of Problem 4.6 on defects in the fabrication of computer chips, but use a negative binomial GLM. Compare results to those for the Poisson GLM. Indicate why results are similar.

Data from Problem 4.6:

An experiment analyzes imperfection rates for two processes used to fabricate silicon wafers for computer chips. For treatment A applied to 10 wafers, the numbers of imperfections are 8, 7, 6, 6, 3, 4, 7, 2, 3, 4. Treatment B applied to 10 other wafers has 9, 9, 8, 14, 8, 13, 11, 5, 7, 6 imperfections. Treat the counts as independent Poisson variates having means µ_A and µ_B.