21. Destructive tests on the life of an electronic component were conducted on 2 different occasions. On

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21. Destructive tests on the life of an electronic component were conducted on 2 different occasions. On the first occasion, 3 tests had a mean of 3320 h; on the second occasion, 2 tests had a mean of 3180 h. What is the weighted average?

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Quality Improvement

ISBN: 9780132624411

9th Edition

Authors: Dale Besterfield

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