1. Using the SRIM software (available free download from www.srim.org) plot the sputtering yield vs energy for following incident species at normal incidence: H on Li and W; Ar on Si, and Xe on Li and W materials. Select energies between the sputter threshold and beyond the sputter yield maximum (plot in log-log scale). Comment on the various regions of the sputter yield as introduced in class. For example, compare and discuss between light particle bombardment and heavy-particle bombardment. Be descriptive and thorough in your discussion. 1. Using the SRIM software (available free download from www.srim.org) plot the sputtering yield vs energy for following incident species at normal incidence: H on Li and W; Ar on Si, and Xe on Li and W materials. Select energies between the sputter threshold and beyond the sputter yield maximum (plot in log-log scale). Comment on the various regions of the sputter yield as introduced in class. For example, compare and discuss between light particle bombardment and heavy-particle bombardment. Be descriptive and thorough in your discussion