1)Temperature fluctuations can seriously damage transistor components in computer Chip manufacturing companies. A quality control engineer is investigating the relationship between temperature rate and the number of subatomic components. The data for a random sample of 12 days are given in the following table

temp, x 85, 89, 81, 86, 78, 92, 80, 84, 80, 82, 85

# of Faulty components 59, 71, 56, 57, 40, 71, 61, 52, 46, 53, 50, 60

a) Find the correlation coefficient R.

b) Find the equation of the Regression Line

c) b)Predict () given = 100.

draw bell-curve and show work plz