5. The number of defects from an inspection of 30 successive wafers, each containing 100 chips is given as follows (read top to bottom and left to right). a) Create the appropriate control chart for the data. b) From the control chart, would you conclude that the process is in statistical control? c) If any out of control points by Western Electric runs rule 1 are observed, assume they have assignable causes and can be omitted from control limit estimates. Create a revised control chart for the reduced data. d) What control plan would you recommend for Phase 2 future production? Wafer Defects Wafer Defects Wafer Defects l 17 11 18 21 22 2 26 12 33 22 24 3 31 13 29 23 30 4 25 14 17 24 25 5 26 15 28 25 26 6 29 16 26 26 28 7 36 17 19 27 22 8 26 18 31 28 31 9 25 19 27 29 18 10 21 20 24 30 23