A 200 mm CMOS wafer contains 387 individual ICs. The threshold voltage of MOSFETs is specified as 0.70 i 0.10 V. It is measured at sixteen sites on each wafer and the mean value of the sample of sixteen sites is recorded. After a large number of wafers has been tested the mean and standard error of the sample means are found to be 0.728 V and 0.012 V respectively. (ii) Estimate the average number of ICs on each wafer that meets the specification. (4)