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A cantilevered beam is subject to an axial load. The beam is instrumented with semiconductor-based strain gauges as part of a bridge circuit. All the

A cantilevered beam is subject to an axial load. The beam is instrumented with semiconductor-based strain gauges as part of a bridge circuit. All the resistors in the bridge circuit have a nominal resistance of R0 = 125 [Ω] and the strain gauges have a gauge factor of Gf = 85. In every case, the bridge circuit is balanced prior to loading the beam such that Vo = 0 [v].
  

R2 R3 R1 V. F R RA R3 Measurement System Setup If the static load imparts a static strain of = 5 x 10-* (m/m] and a source voltage of V, = 2 [V] is applied to the bridge, a) What is the change in strain gauges' resistance? (10 pts.) b) What is the change in output voltage from the bridge due to the application of the load? (10 pts.) c) What change in resistance AR4 [SN], from R4 Ro +AR4 [0], is now required to balance the bridge? (10 pts.)

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