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A semiconductor temperature measuring device is tested by placing it in an environment that is maintained at a constant temperature of 150C, which is measured
A semiconductor temperature measuring device is tested by placing it in an environment that is maintained at a constant temperature of 150C, which is measured by an accurate, calibrated resistance thermometer. A set of 12 measurements is made as a reference to assess the standard deviation and standard error of the mean for measurements made by the device. The measurements obtained for this reference set are given as: 150.7 149.8 150.4 153.5 147.6 148.5 152.4 151.5 149.3 149.9 146.6 150.2 When the sensor is subsequently used in a workplace to measure the temperature in an enclosed vessel, a reading of 137C is obtained. What is the likely error in this measurement, expressed to a 95.0% confidence limit
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