a$.$ Statistical Tlerancing increases FTY above that of Worst Case Tolerancing.

b$.$ Pbar is equal to the variance of the process distribution.

c$.$ In an Xbar Chart, UCLX is always less than the Upper Specification Limit $($USL$).$

d$.$ If Cpk $<0,$ the process mean is not within the specification limits$.$

e$.$ Reducing assembly parts counts through DFM increases OFD$$s$.$

f$.$ Defects add in a multi$-$step manufacturing process.

g$.$ In Worst Case analysis, the probability of parts interference is always $0\%.$

h$.$ For Cpk $>2,$ C charts are preferred for Statistical Process Control.

i$.$ FTY$=1-$DPU is a generally acceptable approximation for DPU$$s $<0.$

j$.$ The MTM method is generally usable only in the Manufacturing Stages.

k$.$ Reducing the $\backslash$sigma of a process always increases the Cpk$.$