Design for test

Give the scheme and explain the operation of a SCAN flip$-$flop with its various data

signals and commands.

Reproduce the simplified circuit diagram below and add the insertion of SCAN and

explain the principle of the method.

Explain in a few lines how it is possible to use the SCAN method to test delay faults.

Considering the LFSR below initialized with the $0001$ state, give the graph and the

polynomial. Is the polynomial primitive?