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Divide and Conquer problem 4-5 Chip testing Professor Diogenes has n supposedly identical integrated-circuit chips that in prin- ciple are capable of testing each other.
Divide and Conquer problem 4-5 Chip testing Professor Diogenes has n supposedly identical integrated-circuit chips that in prin- ciple are capable of testing each other. The professor's test jig accommodates two chips at a time. When the jig is loaded, each chip tests the other and reports whether it is good or bad. A good chip always reports accurately whether the other chip is good or bad, but the professor cannot trust the answer of a bad chip. Thus, the four possible outcomes of a test are as follows: Chip A says B is good B is good B is bad B is bad Chip B says A is good A is bad A is good a least one is bad A is bad Conclusion both are good, or both are bad at least one is bad at least one is bad b. Consider the problem of finding a single good chip from among n chips, as- suming that more than n/2 of the chips are good. Show that In/2] pairwise tests are sufficient to reduce the problem to one of nearly half the size
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