Eagle Semiconductor Inc. is studying the failure times of itsmicrochips (in hours) at different solder temperatures (degrees Celsius). The data for one experiment are given below. Eagle is trying to predict the time to failure based on solder temperature.

y TimetoFailure(hours)	x Temperature(degreesCelsius)
9700	120
8300	125
5500	129
5300	131
5100	132
4700	133
4300	135
3550	144
3650	143
3400	142
1250	148
1150	149
510	147
650	152
1300	154
1250	156
850	159
670	158
550	156
220	163

Eaglehashypothesizedthefollowingmodely=b0+b1x+ebetweentimetofailure and temperature.

a

Using Excel or SPSS,constructa scatterplotfor thedata. Attach your scatterplot. Is there evidence of a linear trend?

b.

Using ExcelorSPSS,estimate theunknownparametersb0andb1andreport theleast squares prediction equation below. Attach your output from Excel or SPSS.

c.

Graphtheprediction equationyoudevelopedinpart b(attachyour graphfrom Excel or SPSS) and assess how the model fits the data visually.

d.

Investigate the usefulness of the model you developed in part b. Is time to failure linearly related to temperature? Test using a= .01.

e.

Interpretthevalueofr2.

f.

Use the model developed in part b to generate a point estimate of the mean time to failure when the temperature is 142 degrees Celsius.