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Figure A.1 shows the Reflection high energy electron diffraction (RHEED) specular spot intensity recorded during the growth of a GaAs layer. If the peak values

Figure A.1 shows the Reflection high energy electron diffraction (RHEED) specular spot intensity recorded during the growth of a GaAs layer. If the peak values are 7.0 and 35.6 seconds for Peak A and B in Figure A.1, respectively, estimate the growth time required for the 200-nm GaAs layer based on the growth rate in Figure A.1. The average thickness of a GaAs monolayer is 0.28 nm.

A Specular Spot Intensity nim. 50 10 30 40 20 Time (s) Figure A.1 

A B ww. 20 30 50 10 40 Time (s) Figure A.1 Specular Spot Intensity

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