Integrated circuits are manufactured on silicon wafers through a process that involves a series of steps. An experiment was carried out the effect on the yield of using three methods in the cleansing step. The results of the experiment can be found on the Yield-OneWay.xls Excel file. The reported values are an index of production (higher is better!).

1. Set up the null and alternative hypotheses.
2. Using the Excel file indicated above, is there evidence that the results of the cleaning methods are statistically different? In answering the question, interpret the p-value of this test.

Descriptives:

New method 1		New Method 2		Standard
Mean	31.83333333	Mean	31.66666667	Mean	30.5
Standard Error	2.971157649	Standard Error	2.577681991	Standard Error	1.979057
Median	34	Median	34.5	Median	30.5
Mode	38	Mode	35	Mode	#N/A
Standard Deviation	7.277820186	Standard Deviation	6.314005596	Standard Deviation	4.84768
Sample Variance	52.96666667	Sample Variance	39.86666667	Sample Variance	23.5
Kurtosis	1.304369523	Kurtosis	2.409956264	Kurtosis	1.784156
Skewness	-1.307886825	Skewness	-1.630923303	Skewness	-2.5E-17
Range	19	Range	17	Range	15
Minimum	19	Minimum	20	Minimum	23
Maximum	38	Maximum	37	Maximum	38
Sum	191	Sum	190	Sum	183
Count	6	Count	6	Count	6

Test:

SUMMARY
Groups	Count	Sum	Average	Variance
New method 1	6	191	31.83333	52.96667
New Method 2	6	190	31.66667	39.86667
Standard	6	183	30.5	23.5

ANOVA
Source of Variation	SS	df	MS	F	P-value	F crit
Between Groups	6.333333	2	3.166667	0.081662	0.92199	3.68232
Within Groups	581.6667	15	38.77778
Total	588	17

DATA:

New method 1	New Method 2	Standard
38	29	31
34	35	23
38	34	38
34	20	29
19	35	32
28	37	30