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Investigating water wave interfer X + V X > C D https://tvdsb.elearningontario.ca//content/enforced/21691954-EL_SCI_SPH4UV-01_906581_2223Sem2/course_content/assets/locker_docs/sph4u_04.01.Id1.pdf?_&d21SessionVal=M... @ E Investigating water wave interference: Two-point source pattern 1 / 2 |
Investigating water wave interfer X + V X > C D https://tvdsb.elearningontario.ca//content/enforced/21691954-EL_SCI_SPH4UV-01_906581_2223Sem2/course_content/assets/locker_docs/sph4u_04.01.Id1.pdf?_&d21SessionVal=M... @ E Investigating water wave interference: Two-point source pattern 1 / 2 | - 80% + Investigating water wave interference: Two-point source pattern Observations: Measured Wavelength: Table 1: Data Measurements for Simulated Two-Point Source Water Interference Pattern (Nodal Lines) Nodal line (n) P.S, (mm) P.$2 (mm) P.S,-P.,S2 (mm) P.S,-P.$2//A 2 2 Table 2: Data Measurements for Simulated Two-Point Source Water Interference Pattern (Anti- nodal Lines) Anti-Nodal line (m) PmS, (mm) PmS2 (mm) [PmS1-PmS2|(mm) PmS,-PmS2 /A 0 9.C 11:23 AM Mostly sunny Q Search ENG US 2023-05-17 2Investigating water wave interfer X + V X > C D https://tvdsb.elearningontario.ca//content/enforced/21691954-EL_SCI_SPH4UV-01_906581_2223Sem2/course_content/assets/locker_docs/sph4u_04.01.Id1.pdf?_&d21SessionVal=M... @ E Investigating water wave interference: Two-point source pattern 2 / 2 | - 67% + Investigating water wave interference: Two-point source pattern Summary: Nodal lines: a. For a point on the first nodal line (P,), the path difference between path length P, to S, and path length P, to S2 will always be_ b. For a point on the second nodal line (P2), the path difference between path length P2 to S, and path length P2 to S2 will always be_ c. For a point on the third nodal line (P3), the path difference between path length P3 to $1 and from P3 to $2 will always be_ Anti-nodal lines: a. For a point on the central antinodal line (Po, m = 0), the path difference between 2 path length Po to S, and path length Po to S2 will always be_ b. For a point on the first antinodal line (P,, m = 1), the path difference between path length P, to S, and path length P1 to S2 will always be_ c. For a point on the second antinodal line (P2, m = 2), the path difference from P2 to S, and from P2 to S2 will always be_ The general path difference formula for destructive interference: IP, S1 - Pn S21 = (1 - 2)2 State the general path difference formula for constructive interference. 9.C b 11:23 AM Mostly sunny Q Search ENG US 2023-05-17 2D2L Announcer X D2L 4.1: Underst X Wave interf X Investigatin X Homework X Lab investiga X Lab.pdf - La x * [Solved] . x E Untitled do X C 32. A stude X + V X F- CD https://tvdsb.elearningontario.ca//content/enforced/21691954-EL_SCI_SPH4UV-01_906581_2223Sem2/course_content/assets/locker_docs/sph4u_04.01.Id2.pdf?_&d2|SessionVal=MTFmC... E Wave interference investigation 1 / 1 - 100% + Wave interference investigation Measurement instructions: Use figure 1 to make your measurements and record these measurements in the document called "Investigation into wave interference". 1. Using a ruler, measure and record, (in millimetres) the wavelength of the wave by measuring from the centre of one crest to the centre of another crest in Figure 1 . 2. Measure the path length from S1 to the point on the first nodal line. Record this value in the table provided in the document called "Investigation into wave interference". For consistent measurements begin and end your measurements from the cross-hairs on the point sources and points. 3. Measure the path length from $2 to the point on the first nodal line. Record this value in the same document provided. 4. Complete the first row of the table provided by subtracting the path lengths to determine the path difference, and then expressing the path difference in terms of wavelength by dividing the path difference by the wavelength. 5. Repeat steps 2-4 for the points on the second and third nodal lines. 6. Now repeat steps 2-4 for the points on anti-nodal lines 0, 1, 2, and 3. n = 3 OF sph4u_04.01.Id1.pdf Lab report writin...docx w= Lab report writin..docx STSE RFID Techn...docx Show all X 1 9.C Q Search ENG 11:22 AM Mostly sunny US 2023-05-17
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