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Japanese researchers have developed a compression - depression method of testing electronic circuits based on Huffman coding. The new method is designed to reduce the
Japanese researchers have developed a compressiondepression method of testing electronic circuitsbased on Huffman coding. The new method is designed to reduce the time required for inputdecompression and output compression called the compression ratio. Experimental results wereobtained by testing a sample of benchmark circuits all of different sizes from a SUN Blade workstation Each circuit was tested with the standard compressiondepression method and the newHuffmanbased coding method and the compression ratio recorded. The data are given in the tablebelowCompare the two methods with a confidence interval. Which method has the smaller meancompression ratio?
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