Problem 5-G. In a production run of n transistors, some transistors fall below the minimum allowable drain current specification with a small probability p, and some exceed the maximum allowable drain current, also with the same probability p. Since the physical mechanisms causing the drain current to be too large or too small are entirely different, the failure to meet each of the two specifications are independent events. Find the probability mass function of the total number of transistors that fail the specification for one or the other reason.