Q6 The results of a study conducted as part of a yield-improvement effort at a semiconductor manufacturing facility provided defect data for a sample of 450 wafers. The following contingency table presents a summary of the response to two questions: "Was a particle found on the die that produced the wafer?" and "Is the wafer good or bad?" Quality of Wafer Particles Good Bad Totals Yes 14 36 50 No 320 80 400 Totals 334 116 450 a. At the 0.05 level of significance, is there evidence of a significant difference between the proportion of good and bad wafers that have particles? b. Determine the p-value in (a) and interpret its meaning. c. Construct and interpret a 95% confidence interval estimate of the difference between the population proportion of good and bad wafers that contain particles. d. What conclusions can you draw from this analysis