the article "Limited Yield Estimation for Visual I')erect Sources" I Hi 15E Tram. rm Semiconductor Marm. 1997: 174.3} reported that, in a study of a particular wafer inspection process, 356 dies were examined by an inspec- tion probe and 201 of these passed the probe. Assuming a stable process, calculate a 95% (two-sided) condence interval for the proportion of all dies that pass the probe