The target thickness for silicon wafers used in a certain type of integrated circuit is 245 m. A sample of 50 wafers is obtained and the thickness of each one is determined, resulting in a sample mean thickness of 246.18 m and a sample standard deviation of 3.60 m.

Does this data suggest that true average wafer thickness is larger than the target value? Carry out a test of significance at level .01 and provide the corresponding P-value.