You are a technician employed at a commercial materials testing and characterisation facility. You are given a sample of an unknown metal and are required to identify it by X-ray diffraction and to determine its basic crystal structure and density. You complete a diffraction measurement of the unknown metal sample using an X-ray powder diffractometer equipped with monochromatic Cu-K radiation (wavelength of 0.1542 nm) over a scan range of 5-90 (29). The resultant pattern is shown in Figure 1 (reduced to a 29 range of 30-90 because no diffraction peaks were observed below 30 (29)). The diffraction peaks of the pattern have been indexed to determine that the metal is of the cubic crystal system and has Miller indices as indicated in the pattern.