Refer to the IEICE Transactions on Information & Systems (Jan. 2005) comparison of two methods of testing electronic circuits, Exercise 8.50. Recall that each of 11 circuits was tested using the standard compression/depression method and the new Huffman based coding method and the compression ratio recorded. The data are reproduced in the accompanying table.

a. In Exercise 8.50, you tested the theory that the Huffman coding method will yield a smaller mean compression ratio than the standard method using a t test. Perform the alternative nonparametric test, using α = .05.

b. Do the conclusions of the two tests agree?

Data from Exercise 8.50

Refer to the IEICE Transactions on Information & Systems (Jan. 2005) comparison of two methods of testing electronic circuits, Exercise 7.52. Each of 11 circuits was tested using the standard compression/depression method and the new Huffman based coding method, and the compression ratio recorded. The data are reproduced in the accompanying table. In theory, the Huffman coding method will yield a smaller mean compression ratio.

Data from Exercise 7.52

Japanese researchers have developed a compression/depression method of testing electronic circuits based on Huffman coding. (IEICE Transactions on Information & Systems, Jan. 2005.) The new method is designed to reduce the time required for input decompression and output compression—called the compression ratio. Experimental results were obtained by testing a sample of 11 benchmark circuits (all of different sizes) from a SUN Blade 1000 workstation. Each circuit was tested using the standard compression/depression method and the new Huffman-based coding method, and the compression ratio was recorded. The data are given in the next table. Compare the two methods with a 95% confidence interval.

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CIRCUITS Huffman Huffman Standard Standard Coding Method Coding Method Circuit Method Circuit Method 1 .80 .78 7 .99 .82 .80 .80 8 .98 .72 3 .83 .86 9 .81 45 4 .53 .53 10 .95 .79 5 .50 .51 11 .99 .77 .96 .68 2.