A device is to be used as an element in a SIF in low-demand mode. The failure
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A device is to be used as an element in a SIF in low-demand mode. The failure rates are given as:
What is the SFF? If this were a Type B component in a 1oo1 architecture, what SIL level would the design qualify for per IEC 61508, Route 1H?
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Related Book For
Safety Instrumented System Design Techniques And Design Verification
ISBN: 9781945541438
1st Edition
Authors: Iwan Van Beurden, William Goble
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