Question: An article in the IEEE Transactions on Instrumentation and Measurement (Direct, Fast, and Accurate Measurement of VT and K of MOS Transistor Using VT-Sift Circuit,
An article in the IEEE Transactions on Instrumentation and Measurement (Direct, Fast, and Accurate Measurement of VT and K of MOS Transistor Using VT-Sift Circuit, Vol. 40, 1991, pp. 951955) described the use of a simple linear regression model to express drain current y (in milliamperes) as a function of ground-to-source voltage x (in volts). The data are as follows:
(a) Draw a scatter diagram of these data. Does a straight-line relationship seem plausible?
0.734 1.50 1.1 1.6 0.886 1.2 1.7 1.66 1.04 1.3 1.81 1.8 1.97 1.19 1.4 1.9 1.35 1.5 2.12 2.0
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a b Independent variable CONSTANT X 22 19 c Source Model Error 16 13 1 07 Y... View full answer
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