An article in Electronic Components and Technology Conference (2001, Vol. 52, pp. 1167–1171) compared single versus dual spindle saw processes for copper metallized wafers. A total of 15 devices of each type were measured for the width of the backside chipouts, and .

(a) Do the sample data support the claim that both processes have the same chip outputs? Use and assume that both populations are normally distributed and have the same variance. Find the P-value for the test.

(b) Construct a 95% two-sided confidence interval on the mean difference in spindle saw process. Compare this interval to the results in part (a).

(c) If the -error of the test when the true difference in chip outputs is 15 should not exceed 0.1, what sample sizes must be used? Use .