73. The authors of the article “A Probabilistic Insulation Life Model for Combined Thermal-Electrical Stresses” (IEEE Trans. on Elect. Insulation, 1985: 519–522) state that “the Weibull distribution is widely used in statistical problems relating to aging of solid insulating materials subjected to aging and stress.” They propose the use of the distribution as a model for time (in hours) to failure of solid insulating specimens subjected to AC voltage. The values of the parameters depend on the voltage and temperature; suppose 
2.5 and

200 (values suggested by data in the article).