The following table provides data on wafers categorized by location and contamination levels. More generally, let the number of wafers with low contamination from the center and edge locations be denoted as n_lcand n_le, respectively. Similarly, let n_hcand n_hedenote the number of wafers with high contamination from the center and edge locations, respectively. Suppose that n_lc= 10n_hcand n_le= 10n_he. That is, there are 10 times as many low contamination wafers as high ones from each location. Let A denote the event that contamination is low, and let B denote the event that the location is center. Are A and B independent? Does your conclusion change if the multiplier of 10 (between low and high contamination wafers) is changed from10 to another positive integer?

Location in Sputtering Tool Center 514 112 626 Total 582 358 Contamination Low Edge 68 246 High 314 Total