The following table provides data on wafers categorized by location and contamination levels. Let A denote the

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The following table provides data on wafers categorized by location and contamination levels. Let A denote the event that contamination is low, and let B denote the event that the location is center. Are A and B independent? Why or why not?


Location in Sputtering Tool Center 514 112 Contamination Low High Total Total 582 358 Edge 68 246 314 626


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Applied Statistics And Probability For Engineers

ISBN: 9781118539712

6th Edition

Authors: Douglas C. Montgomery, George C. Runger

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