The following table shows manufacturing data for various processors. If the number of dies per wafer is

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The following table shows manufacturing data for various processors.a. b. Wafer Diameter 15 cm 20 cm Dies per Wafer 84 100 Defects per Unit Area 0.020 defects/cm 0.031

If the number of dies per wafer is increased by 10% and the defects per area unit increases by 15%, find the die area and yield.

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Computer Organization And Design The Hardware Software Interface

ISBN: 9780123747501

4th Revised Edition

Authors: David A. Patterson, John L. Hennessy

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