Question: The following table shows manufacturing data for various processors. If the number of dies per wafer is increased by 10% and the defects per area

The following table shows manufacturing data for various processors.a. b. Wafer Diameter 15 cm 20 cm Dies per Wafer 84 100 Defects per Unit Area 0.020 defects/cm 0.031

If the number of dies per wafer is increased by 10% and the defects per area unit increases by 15%, find the die area and yield.

a. b. Wafer Diameter 15 cm 20 cm Dies per Wafer 84 100 Defects per Unit Area 0.020 defects/cm 0.031 defects/cm Cost per Wafer 12 15

Step by Step Solution

3.44 Rating (151 Votes )

There are 3 Steps involved in it

1 Expert Approved Answer
Step: 1 Unlock

To find the die area and yield after increasing the number of dies per wafer by 10 and the defects p... View full answer

blur-text-image
Question Has Been Solved by an Expert!

Get step-by-step solutions from verified subject matter experts

Step: 2 Unlock
Step: 3 Unlock

Students Have Also Explored These Related Computer Organization Design Questions!