Question: The following table shows manufacturing data for various processors. If the number of dies per wafer is increased by 10% and the defects per area
The following table shows manufacturing data for various processors.
If the number of dies per wafer is increased by 10% and the defects per area unit increases by 15%, find the die area and yield.
a. b. Wafer Diameter 15 cm 20 cm Dies per Wafer 84 100 Defects per Unit Area 0.020 defects/cm 0.031 defects/cm Cost per Wafer 12 15
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