A 16-run experiment was performed in a semiconductor manufacturing plant to study the effects of six factors on the curvature or camber of the substrate devices produced. The six variables and their levels are shown in Table P8.2.

(a) What type of design did the experimenters use?

(b) What are the alias relationships in this design?

(c) Do any of the process variables affect average camber?

(d) Do any of the process variables affect the variability in camber measurements?

(e) If it is important to reduce camber as much as possible, what recommendations would you make?