1. Consider an amplified measurement C in electrons for a collection site (pixel) in a cooled CCD camera described by C=(S+NA+NP)A where S is the signal in electrons, NA is a zero-mean amplifier noise source with a variance of 2 electrons, NP is a zero-mean photon noise source with a variance of S electrons, A is the constant amplifier gain, and NA and NP are independent. c) For what minimum value of S will the signal-to-noise exceed 50