120 pts) indicate whether the statements below are true (T) or false (F) (2 pts each) An experimentalist would like to analyze her crystalline sample by X-ray diffraction. She realize that the angular (26) range she can measure is imited (and fored) due to the experimental setup. If the experimentalist prefers to measure as many peaks as possible, she should select X-rays from Cu-Ka{X-1.54 Ay wavelength rather than Mo-Ka (-0.71A) An X ray beam with a wavelength of 3 Angstrom wavelength is softer than an X-ray beam with a wavelength of 1 Angstrom If we performan XRD experiment on a crystalline material above its melting point, we should expect fewer intensity peaks than below its melting point We should expect to observe more overlapping diffraction peaks in a powder sample consisting of target particles than that consisting of smaller particles, If we measure the powder diffraction profile of a crystalline sample, we should expect higher angle diffraction peaks to be broader than lower angle diffraction peaks increasing the measuring time during an X-ray didaction experiment reduces the background. (An experimentalist is performing XR measurement simultaneously with a tensile test on a specimen to obtain a relationship between elastic modulus and unit cell parameter. Upon loading the test sample, the X ray peaks shift to higher angles whereas upon unloading the peaks shift to smaller angles In a cubic unit cell planes with higher Miller indices are closer to each other than those with lower Miller indies 120 pts) indicate whether the statements below are true (T) or false (F) (2 pts each) An experimentalist would like to analyze her crystalline sample by X-ray diffraction. She realize that the angular (26) range she can measure is imited (and fored) due to the experimental setup. If the experimentalist prefers to measure as many peaks as possible, she should select X-rays from Cu-Ka{X-1.54 Ay wavelength rather than Mo-Ka (-0.71A) An X ray beam with a wavelength of 3 Angstrom wavelength is softer than an X-ray beam with a wavelength of 1 Angstrom If we performan XRD experiment on a crystalline material above its melting point, we should expect fewer intensity peaks than below its melting point We should expect to observe more overlapping diffraction peaks in a powder sample consisting of target particles than that consisting of smaller particles, If we measure the powder diffraction profile of a crystalline sample, we should expect higher angle diffraction peaks to be broader than lower angle diffraction peaks increasing the measuring time during an X-ray didaction experiment reduces the background. (An experimentalist is performing XR measurement simultaneously with a tensile test on a specimen to obtain a relationship between elastic modulus and unit cell parameter. Upon loading the test sample, the X ray peaks shift to higher angles whereas upon unloading the peaks shift to smaller angles In a cubic unit cell planes with higher Miller indices are closer to each other than those with lower Miller indies