2). Assume a 15 cm diameter wafer has a cost of $12, contains 84 dies, and has 0.00020 defects/mm2. Assume a 20 cm diameter wafer has a cost of $15, contains 100 dies, and has 0.00031 defects/mm2. a. Find the yield for both wafers. b. Find the cost/die for both wafers C. If the number of dies/wafer is increased by 10% and the defects/unit area increased by 15%, find the die area and yield. Assume a fabrication process improves the yield from 0.92 to 0.95. Find the defects/unit area for each version of the technology given a die area of 200 mm2. d