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2. Using the data given below, test the correlation for the temperature and number of defects of the given transistor (Use Spearman rank model, Significance
2. Using the data given below, test the correlation for the temperature and number of defects of the given transistor (Use Spearman rank model, Significance level 0.05) Day Temperature Number of Defects 1 24.2 25 2 22.7 3 l 3 30.5 36 4 28.6 33 5 25.5 19 6 32.0 24 7 28.6 27 8 26.5 25 9 25.3 16 10 26.0 14 l 1 24.4 22 12 24.8 23 13 20.6 20 l 4 25. 1 25 15 21.4 25 16 23.7 23 17 23.9 27 18 25.2 30 l 9 27.4 33 20 28.3 32 21 28.8 35 22 26.6 24
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