30441 Operation Managein xQachon x. + pQLSerly AzTS/YBWZn2zwQWBA50VQND XwCXpag/viewform subasions COMQVA Identify the kind of control charts for attributes according to the definition: O Cpk Control chart for the sample proportion of defectives, and is used to monitor the proportion of defective items generated by the process Used when the goal is to control the number of occurrences of defects per unit product Assumes that defects occur over some continuous region and that the probability of more than one defect at any particular spot is negligible SAIO NVIDIA FORCE F6 Q+ A 6 F7 BUG Y & 7 F8 U O 8 c-chart p-chart Poisson distribution SONY 0 We F9 F10 F11 F12 Prt Sc Pause Sys Rq Insert Break 6 O H J K L ) 0 P 0 44 (Operations Manage /e/1FAIpQLScr7Y A75/YWZnewQWBAD QN20XIwCXpg/viewformsubmesson C product. Assumes that defects occur over some continuous region and that the probability of more than one defect at any particular spot is negligible It is calculated by finding the difference between each of the specification limits and the process mean dividing that difference by three standard deviations of the process, and identifying the smaller ratio O O O C 0 is the appraisal of a good or service against a standard VAIO VIDIA SONY Bac F6 F7 F8 F9 F10 F11 F12 0. VO Prt Sc Sys Rq Pause Break insert 5 & ( + 6 7 8 9 0 T Y U P G H J K