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a . Statistical Tlerancing increases FTY above that of Worst Case Tolerancing. b . Pbar is equal to the variance of the process distribution. c

a. Statistical Tlerancing increases FTY above that of Worst Case Tolerancing.
b. Pbar is equal to the variance of the process distribution.
c. In an Xbar Chart, UCLX is always less than the Upper Specification Limit (USL).
d. If Cpk <0, the process mean is not within the specification limits.
e. Reducing assembly parts counts through DFM increases OFDs.
f. Defects add in a multi-step manufacturing process.
g. In Worst Case analysis, the probability of parts interference is always 0%.
h. For Cpk >2, C charts are preferred for Statistical Process Control.
i. FTY=1-DPU is a generally acceptable approximation for DPUs <0.
j. The MTM method is generally usable only in the Manufacturing Stages.
k. Reducing the \sigma of a process always increases the Cpk.

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