Categorical data and analysis

1) An experiment analyzes imperfection rates for two processes used to fabricate silicon wafers for computer chips. For treatment A applied to 10 wafers, the number of imperfections is 8, 7, 6, 6, 3, 4, 7, 2, 3, 4. Treatment B applied to 10 other wafers has 9, 9, 8, 14, 8, 13, 11, 5, 7, 6 imperfections. Treat the counts as independent Poisson variates having means uA and uB. i) Fit a model of the form log(u) = a + Bx, where x = 0 for treatment A and x = 1 for treatment B. ii) Show that B = log(uB/uA) and interpret your estimate of B obtained in part (i) above. iii) Test HO: MA = uB against two sided alternative H1: UA # uB using Wald test. iv) Construct a Wald type 95% confidence interval for JB/HA