The below table provides the wafer measurements for 25 samples. 

a. Construct appropriate control charts with details calculations and conclusion? 

b. If the wafer specifications are 1.50+/-0.5 microns, what percentage of product will be nonconforming products? 

c. Based on Process Capability Measure, what will be your conclusions? 

d. What is the probability of detecting a shift to µ1=µ0+2?

Flow Width Measurements (microns) for the Hard-Bake Process Wafers Sample Number 3 4 1.3235 1.4128 1.6744 1.4573 1.6914 1.4314 1.3592 1.6075 1.4666 1.6109 3 1.4284 1,4871 1.4932 1.4324 1.5674 4. 1.5028 1.6352 1.3841 1.2831 1.5507 1.5604 1.2735 1.5265 1.4363 1.6441 1.5955 1.5451 1.3574 1.3281 1.4198 7. 1.6274 1.5064 1.8366 1.4177 1.5144 8 1.4190 1.4303 1.6637 1.6067 1.5519 1.3884 1.7277 1.5355 15176 1.3688 10 1.4039 1.6697 1.5089 1.4627 1.5220 11 1.4158 1.7667 1.4278 1.5928 1.4181 12 1.5821 1.3355 1.5777 1.3908 1.7559 13 1.2856 1.4106 1.4447 1.6398 1.1928 14 1.4951 1.4036 1.5893 1.6458 1.4969 IS 1.3589 1.2863 1.5996 1.2497 1.5471 16 1.5747 1.5301 1.5171 1.1839 1.8662 17 1.3680 1.7269 1.3957 1.5014 1.4449 18 1.4163 1.3864 1.3057 1.6210 1.5573 19 1.5796 1.4185 1.6541 1.5116 1.7247 20 1.7106 1.4412 1.2361 1.3820 1.7601 21 1.4371 1.5051 1.3485 1.5670 1.4880 22 1.4738 1.5936 1.6583 1.4973 1.4720 23 1.5917 1.4333 1.5551 1.5295 1.6866 24 1.6399 1.5243 1.5705 1.5563 1.5530 25 1.5797 1.3663 1.6240 1.3732 1.6887