In a semiconductor manufacturing process, three wafers from a lot are tested. Each wafer is classified as pass or fail. Assume that the probability that a wafer passes the test is 0.9 and that wafers are independent. Determine the cumulative distribution function of the number of wafers from a lot that pass the test at specified values. Round your answers to three decimal places (e.g. 0.987). F(0)-PIXSO)-0.001 F(1) P(X 1)-0.027 F(2)-P(X 2)- i 0.243 F(3) P(X3)- 0.729