Integrated circuits are manufactured on silicon wafers through a process that involves a series of steps.An experiment was carried out the effect on the yield of using three methods in the cleansing step.The results of the experiment can be found on the Yield-OneWay.xls Excel file (attached).The reported values are an index of production (higher is better!).

a.Set up the null and alternative hypotheses.

b.Using the Excel file indicated above, is there evidence that the results of the cleaning methods are statistically different? In answering the question, interpret the p-value of this test.

LO O V 4:04 PM 11/17/2020 20 File Tools View Mail Document1 - Saved to this PC X Integrated circuits are manufactured on silicon wafers through a A B C D E F G process that involves a series of steps. An experiment was carried 1 Anova: Single Factor out the effect on the yield of using three methods in the cleansing N SUMMARY step. The results of the experiment can be found on the Yield-One- Groups Count Sum Average Variance Way.xIs Excel file. The reported values are an index of production New method 1 6 191 31.83333 52.96667 6 190 31.66667 39.86667 (higher is better!). 6 New Method 2 7 Standard 183 30.5 23.5 8 a. Set up the null and alternative hypotheses. 9 10 ANOVA 11 Source of Variation SS df MS F P-value F crit b. Using the Excel file indicated above, is there evidence that the 12 Between Groups 6.333333 2 3.166667 0.081662 0.92199 3.68232 13 Within Groups 581.6667 15 38.77778 results of the cleaning methods are statistically different? In 14 answering the question, interpret the p-value of this test. 15 Total 588 17 16 New method 1 New Method 2 Standard Mear 31.83333333 Mean 31.66666667 Mean 30.5 A B C 4 Standard Error 2.971157649 Standard Error 2.577681991 Standard Error 1.979057 5 Median 34 Median 34.5 Median 30.5 6 38 Mode 35 Mode #N/A 1 New method 1 New Method 2 Standard 7 Standard Deviation 7.277820186 Standard Deviation 6.314005596 Standard Deviation 4.84768 Sample Variance 52.96666667 Sample Variance 39.86666667 Sample Variance 23.5 2 38 29 31 9 Kurtosis 1.304369523 Kurtosis 2.409956264 Kurtosis 1.784156 10 Skewness 1.307886825 Skewness 1.630923303 Skewness -2.5E-17 3 34 35 23 11 Range 19 Range 17 Range 15 12 Minimum 19 Minimum 20 Minimum 23 37 Maximum 38 13 Maximum 38 Maximum 38 38 34 14 Sum 191 Sum 190 Sum 183 15 Count 6 Count 6 Count 6 34 20 29 16 19 35 32 28 37 30 End of document Screens 1-2 of 2 Focus + 140%