Problem 3

Consider a 2.4 cm2 die for a 64-bit processor manufactured from a 42 cm-diameter wafer costing $9,000. Assume a wafer yield of 99%. Use the defect model from the lecture notes with 0.016 defects per cm2 and =10. What is the expected cost per die (before testing)? Ignore edge effect correction.

Problem 4

Suppose a processor uses 105W of power while operating at 2.7 GHz, of which 3/4 is dynamic power. Suppose we want to run the same processor at a higher frequency which requires increasing the operating voltage proportionally as well. If a dynamic power consumption increase of up to 130W can be tolerated, by how much can the processor frequency be sped up?

Problem 5

Consider a server farm of 1,200 identical components where a single failure causes the entire system to crash. If each component has an MTTF of 150 days, what is the MTTF of the entire farm? Assume an exponential distribution for component time to failure.