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Semiconductor trends as embodied in the International Technology Roadmap for Semiconductors provide a guide for the challenges facing the failure analysis community. The increased complexity
Semiconductor trends as embodied in the International Technology Roadmap for Semiconductors provide a guide for the challenges facing the failure analysis community. The increased complexity of devices as the industry drives toward system on chip defines the requirements for better test-based methods for isolation as well as better techniques for physical failure site isolation. By referring to minimum 5 technical papers, write a short review paper (around 2500 words) on failure site isolation approach.
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