The data in worksheet attached list electrical resistance values (ohms) for 50 samples of size 5 that were taken from Babbage Chips, Inc.'s computer chip-making process over a 25-hour period.

1	7.954	11.195	8.160	10.040	9.102
2	6.341	7.966	10.678	8.883	11.181
3	8.154	10.596	8.660	9.991	8.856
4	10.119	7.463	10.073	8.074	7.307
5	8.420	7.041	9.829	11.002	8.698
6	9.791	11.616	7.726	11.445	11.557
7	8.466	9.377	6.910	8.998	7.835
8	8.683	8.562	8.284	8.719	7.420
9	10.641	9.383	9.922	9.075	8.877
10	8.994	9.968	10.035	9.766	8.105
11	9.215	9.405	9.186	7.580	7.734
12	8.073	9.343	10.027	8.634	10.266
13	10.686	9.750	10.548	8.363	10.936
14	10.795	7.992	9.063	11.272	8.367
15	9.940	10.634	9.336	9.744	10.267
16	9.524	8.529	9.682	8.134	9.470
17	10.090	7.801	9.281	9.005	11.234
18	8.230	8.421	8.469	9.612	8.758
19	8.864	8.668	10.760	9.328	8.581
20	9.004	9.206	9.036	7.330	9.670
21	9.728	8.045	10.720	9.761	7.910
22	6.910	8.922	9.444	8.222	9.800
23	9.047	8.889	7.063	9.439	7.132
24	8.413	9.927	10.638	9.888	9.611
25	8.712	8.390	7.721	10.349	9.501
26	10.166	8.724	9.762	10.123	9.349
27	9.912	7.640	10.203	9.295	10.703
28	9.824	8.628	10.966	9.590	7.553
29	9.175	9.113	9.415	8.956	12.057
30	7.077	8.173	8.050	8.284	8.725

a. Compute the mean, standard deviation, mode, kurtosis and skewness for the data.

b. Calculate the control limits and construct the x- and R-charts, using the 30 samples. Is the process under control at that point?

c. Specifications for the process are 9.2 ± 3.2 ohms. If the process is under control, calculate the capability indexes, Cpu, Cpl, Cp, and Cpk. What conclusion can you draw from this?