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Un lser de Helio-Nen ( = 632.8 nm) se usa para caracterizar una rejilla de difraccin. Si el mximo del primer orden ocurre a 20.5,

Un lser de Helio-Nen ( = 632.8 nm) se usa para caracterizar una rejilla de difraccin. Si

el mximo del primer orden ocurre a 20.5, cual es el espacio entre rendijas adyacentes?

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