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Using CuK(=0.15418nm), an XRD measurement was made on a piece of single crystal M while it was under uniform elastic stress applied on its (010)
Using CuK(=0.15418nm), an XRD measurement was made on a piece of single crystal M while it was under uniform elastic stress applied on its (010) surfaces. What is the nature (tensile or compressive) and magnitude of this applied stress (in MPa) if the diffraction from the (001) planes was detected at 25.2654 in 2? M has a simple cubic crystal structure with a lattice parameter of 0.35239nm. Assume that it is isotropic in terms of its elastic behavior with an elastic modulus of 207GPa. Take the Poisson's ratio as 0.31
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