Testing electronic circuits. IEICE Transactions on Information & Systems (January 2005) published a comparison of two methods of testing electronic circuits. Each of 11 circuits was tested using the standard compression/ depression method and the new Huffman-based coding method and the compression ratio recorded. The data are listed in the table. Use a nonparametric procedure to determine whether the Huffman coding method will yield smaller compression ratios than the standard method. Test, using a = .05. Circuit Standard Method Huffman Coding Method 1 .80 .78 2 .80 .80 3 .83 .86 4 .53 .53 5 .50 .51 6 .96 .68 7 .99 .82 8 .98 .72 9 .81 .45 10 .95 .79 11 .99 .77 Source: T. Inoue, M. Shintani, and H. Ichihara, “Huffman-Based Test Response Coding,” IEICE Transactions on Information & Systems, Vol. E88-D (Table 3), 2005.