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Defects In SiO2 And Related Dielectrics Science And Technology(2000 Edition)

Authors:

Gianfranco Pacchioni, Linards Skuja, David L. Griscom

Free defects in sio2 and related dielectrics science and technology 2000 edition gianfranco pacchioni, linards
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Book details

ISBN: 0792366859, 978-0792366850

Book publisher: Springer